New Problem Solver Sensor for Smart Object Detection
SICK is launching its latest generation of miniature photoelectric sensors, the W4F. A new ASIC platform delivers numerous performance advantages to this product family. The W4F can also provide distance information, such as the height of objects and, as a result, identify process errors.
The Blue Pilot operating concept combined with the innovative monitoring options make configuring and monitoring the sensors easier than ever which saves time during commissioning. IO-Link and new smart functions for sensor monitoring and diagnostics create the link to the digitalized machine and application world.
The next generation W4F with its highly rugged Vistal® plastic housing reportedly offers sensor functions and performance characteristics that were previously only available in the larger W16 and W26 product families from SICK.
The foundation for this performance is the development of a new ASIC that enables both the two light-intensive pin-point emitter LEDs and the diffuse LED to be operated concurrently without any appreciable heating of the sensor.
The ASIC directly digitizes the photocurrents of the reflected light at each pixel of the multipixel receiver, enabling the sensor to achieve not only a very high sensitivity but also a long sensing range and reliable detection behavior even for poorly reflecting object surfaces.
The sensors in the Optical Standard business field are a through-beam photoelectric sensor and a photoelectric retro-reflective sensor, each with a long sensing range as well as two photoelectric proximity sensors with background suppression. One of the photoelectric proximity sensors offers an exceptionally concentrated light beam and point geometry, enabling the sensor to also detect jet black objects with a remission of less than one percent.
For especially challenging situations, users can trust in the Optical Experts as these SICK sensors have been designed for specific applications. With the help of its laser-like light spot, its V-optics, and its specially tailored optics design, the V-Optics variant can reliably detect even the most reflective or transparent objects such as wafers or displays.
For more information, visit https://www.sick.com.